Optical Imaging and Spectroscopy meets AFM
neaspec neaSNOM Microscope
Based on neaspec's revolutionary technology, neaSNOM is the only microscope on the market capable of imaging & spectroscopy in the visible, infrared and even terahertz spectral region at 10 nm spatial resolution.
A large number of applications can be addressed with the neaSNOM microscope, including: nanoscale chemical identification of materials; analysis of functional nanostructures; and the characterization of photonic nanodevices or waveguide structures. This innovative product is based on a proprietary Atomic Force Microscope (AFM) core module designed for high-performance near-field measurements. It is complemented with a series of patented detection and illumination modules for reliable and reproducible (background-free) near-field microscopy and spectroscopy.
Features
- Based on high-stability, scanning-sample Atomic Force Microscope optimized for optical nanoscopy
- Optical focusing unit accepts visible, infrared and terahertz illumination
- Patented dual-port design allows two independent module bays for imaging and spectroscopy at the same time as THz-TDS
- Highly efficient optical near-field detection technique with patented background suppression
- Dedicated near-field detection modules optimized for high performance near-field imaging & spectroscopy
- Transmission mode module for high performance near-field measurements with transparent samples (e.g. polymers)
Atomic Force Microscope (AFM) Specifications
- Compact size X,Y,Z: 30 cm x 45 cm x 30 cm
- Coarse positioning ranges: X = 60 mm, Y = 15 mm, and Z = 8 mm
- Coarse positioning resolution: < 200 nm
- Scan-area: 100 µm x 100 µm X,Y closed-loop scan range
- Scan-resolution X,Y: 0.2 nm (open-loop), 0.4 nm (closed-loop)
- Scan-speed: up to 20 µm/s
- Scan-time for e.g. 100 x 100 pixel = 1 x 1 µm image: 35s
- Noise-limited Z-resolution (RMS): ≤ 0.2 nm
- Scan Z-range: 2.5 µm
- Maximum sample size: 40 x 50 x 15 mm (X,Y,Z)
Application Areas
In general, neaspec separates two main application directions:
- Near-field illumination units for imaging (NIM): Single-line (CW) lasers allow for amplitude- and phase-resolved near-field imaging simultaneous to topographic imaging at scanning speeds of standard AFM technology. With this unit, spectroscopy can be performed by tuning of the light source.
- Nano-FTIR spectroscopy: Broadband light source (i.e., super-continuum lasers, IR beam lines of synchrotrons, broadband IR lasers, etc.) near-field spectroscopy at selected sample positions or hyperspectral imaging can be performed. The spectral range for the measurement is determined by the bandwidth of the light source. Signal detection and analysis is similar to conventional FTIR spectroscopy, hence this option is established as nano-FTIR.
nanoFTIR (Near-Field Detection Module for Spectroscopy)
The neaSNOM can be equipped with optical imaging and/or optical spectroscopy.
The optical spectral region, in particular the "material fingerprint region in infrared," allows the investigation of a large variety of material properties. The patented technology brings this interesting long-wave spectral region to the nanoscale.
Nano-FTIR can be applied in many disciplines where high resolution chemical identification is required, such as chemistry, semiconductor technology, polymer science and life sciences. It only requires standard AFM sample preparation.
Features
- Reflective AFM-tip illumination
- Detection optimized for high-performance near-field spectroscopy
- Patented background-free detection technology
- Based on optimized Fourier-Transform spectrometer
- Up to 3 spectra per second
- Standard spectral resolution: 6.4/cm
- Upgrade to 3 cm-1 spectral resolution available
- Suited for visible & infrared detection (0.5 – 20 µm)
- Exchangeable beam-splitter mount included
